Integrating in-situ multi-modal characterizations with signatures to investigate localized deformation

D. J. Shadle, K. E. Nygren, J. C. Stinville, M. A. Charpagne, T. J.H. Long, M. P. Echlin, C. J. Budrow, A. T. Polonsky, T. M. Pollock, I. J. Beyerlein, M. P. Miller

Research output: Contribution to journalArticlepeer-review

Abstract

Multi-modal approaches are often essential for exploring the intricate facets of complex materials phenomena. Each characterization technique contributes a unique perspective that, when linked with other techniques, enables a more holistic and comprehensive study. Sometimes direct interpretations of material response between techniques become infeasible, necessitating the use of indirect interpretations or signatures to build a complete understanding. In this work, we present a case study that combines signature discovery with electron and synchrotron X-ray characterization techniques to identify regions of intense slip localization - a complex material phenomenon - via a signature within an Inconel-718 alloy undergoing mechanical deformation. This signature relies on the higher order moments of single grain orientation distributions, which prove sensitive to localized deformation. We report the intergranular stress states within a grain neighborhood identified through this signature.

Original languageEnglish (US)
Article number113332
JournalMaterials Characterization
Volume205
DOIs
StatePublished - Nov 2023
Externally publishedYes

Keywords

  • Electron backscatter diffraction
  • High energy X-ray diffraction microscopy
  • Intragranular deformation
  • Signature discovery

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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