Integrated CAD, CAM and CAT of VLSI Circuits and Systems: The CMU Perspective

Stephen W. Director, Wojciech Maly, Rob A. Rutenbar, John P. Shen, Daniel P. Siewiorek, Andrzej J. Strojwas, Donald E. Thomas

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)87-100
Number of pages14
JournalIEEE Design and Test of Computers
Volume2
Issue number3
DOIs
StatePublished - Jun 1985

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this