Information content of the near field: Two-dimensional samples

Richard A. Frazin, David G. Fischer, P. Scott Carney

Research output: Contribution to journalArticlepeer-review

Abstract

Limits on the effective resolution of many optical near-field experiments are investigated. The results are applicable to variants of total-internal-reflection microscopy (TIRM), photon-scanning-tunneling microscopy (PSTM), and near-field-scanning-optical microscopy (NSOM) in which the sample is weakly scattering and the direction of illumination may be controlled. Analytical expressions for the variance of the estimate of the complex susceptibility of an unknown two-dimensional object as a function of spatial frequency are obtained for Gaussian and Poisson noise models, and a model-independent measure is examined. The results are used to explore the transition from near-zone to far-zone detection. It is demonstrated that the information content of the measurements made at a distance of even one wavelength away from the sample is already not much different from the information content of the far field.

Original languageEnglish (US)
Pages (from-to)1050-1057
Number of pages8
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume21
Issue number6
DOIs
StatePublished - Jun 2004

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

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