Abstract
The influence of the pressure increase in a small multiple-beam klystron on the Os-coated M-type cathode, operating at a peak current density of 75 A/cm2, was experimentally studied. The relationship between the pressure and the emission current density was plotted. According to the plot, at 1.0×10-5 Pa, the current density was found to decrease by 1.96%; at 2.07×10-4 Pa, the current density dropped by 10%, and the cathode was found to be dying. The leakage-induced degradation possibly originated from two major factors: one is the oxidation of Ba+(a)into Ba2+ on the surface, inversely affecting the surface emission; the other is the de-activation of the emission sites by ion sputtering, resulted from the leaked-in gases, oxygen in particular. We concluded that the leakage accounts for the emission degradation.
Original language | English (US) |
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Pages (from-to) | 224-227 |
Number of pages | 4 |
Journal | Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology |
Volume | 33 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2013 |
Externally published | Yes |
Keywords
- Electron emission
- M-type cathode
- Mechanism
- Os film
- Vacuum pressure
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry