Influence of interfacial disorder and temperature on magnetization reversal in exchange-coupled bilayers

M. R. Fitzsimmons, C. Leighton, A. Hoffmann, P. C. Yashar, J. Nogués, K. Liu, C. F. Majkrzak, J. A. Dura, H. Fritzsche, Ivan K. Schuller

Research output: Contribution to journalArticle

Abstract

Polarized neutron reflectometry is used to measure the thermal response of the net-magnetization vector of polycrystalline ferromagnetic (F) Fe films exchange coupled to twinned (110) MnF2 antiferromagnetic (AF) layers. We observe a strong correlation between the temperature dependencies of the net sample magnetization perpendicular to the applied field at coercivity and exchange bias. For cooling field and measurement conditions involving magnetization reversal via rotation, we find a range of temperature dependencies. For the smoothest F-AF interface, the temperature dependence of exchange bias compares well to a S=5/2 Brillouin function - an observation predicted by some theoretical models. This temperature dependence is expected for the sublattice magnetization and the square root of the anisotropy constant √K1 of bulk MnF2. In contrast, for a rough F-AF interface the magnetization reversal process (and exchange bias) showed little temperature dependence up to temperatures approaching the AF Néel point - a clear consequence of increasing interfacial disorder in a F-AF epitaxial system.

Original languageEnglish (US)
Article number104415
Pages (from-to)1044151-1044155
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume64
Issue number10
DOIs
StatePublished - Sep 1 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Fitzsimmons, M. R., Leighton, C., Hoffmann, A., Yashar, P. C., Nogués, J., Liu, K., Majkrzak, C. F., Dura, J. A., Fritzsche, H., & Schuller, I. K. (2001). Influence of interfacial disorder and temperature on magnetization reversal in exchange-coupled bilayers. Physical Review B - Condensed Matter and Materials Physics, 64(10), 1044151-1044155. [104415]. https://doi.org/10.1103/PhysRevB.64.104415