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Infill asymptotics for a stochastic process model with measurement error
Huann Sheng Chen
,
Douglas G Simpson
, Zhiliang Ying
Statistics
Beckman Institute for Advanced Science and Technology
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peer-review
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Keyphrases
Measurement Error
100%
Infill Asymptotics
100%
Stochastic Process Model
100%
Spatial Modeling
66%
Ornstein-Uhlenbeck
66%
Maximum Likelihood Estimator
33%
Parameter Vector
33%
Parameter Estimation
33%
Asymptotic Distribution
33%
Series Analysis
33%
Fine Mesh
33%
Nugget
33%
Increasing Domain Asymptotics
33%
Measurement Error Variance
33%
Nugget Effect
33%
Fourth Root
33%
Compact Intervals
33%
Additive White Noise
33%
Mathematics
Asymptotics
100%
Measurement Error
100%
Stochastic Process
100%
Parameter Vector
25%
Maximum Likelihood Estimator
25%
Asymptotic Distribution
25%
Error Variance
25%
Parameter Estimate
25%
Sample Size Increase
25%
Compact Interval
25%
Time Series Analysis
25%