Inertial tip translator for a scanning tunneling microscope

R. T. Brockenbrough, Joseph W Lyding

Research output: Contribution to journalArticle

Abstract

A two-dimensional micropositioning device for scanning tunneling microscope (STM) probes has been developed. This device uses the principle of piezoelectric inertial translation to produce a controlled stepping motion of the probe along vertical and horizontal axes over distances of several mm. The tip micropositioner is controlled by the same electrical signals that drive the scanning piezoelectric element, thus alleviating the need for additional electronic control elements. This device has been tested on STMs operating in air and in ultrahigh vacuum environments.

Original languageEnglish (US)
Pages (from-to)2225-2228
Number of pages4
JournalReview of Scientific Instruments
Volume64
Issue number8
DOIs
StatePublished - Dec 1 1993

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translators
Microscopes
microscopes
Scanning
scanning
Ultrahigh vacuum
electronic control
probes
ultrahigh vacuum
Air
air

ASJC Scopus subject areas

  • Instrumentation

Cite this

Inertial tip translator for a scanning tunneling microscope. / Brockenbrough, R. T.; Lyding, Joseph W.

In: Review of Scientific Instruments, Vol. 64, No. 8, 01.12.1993, p. 2225-2228.

Research output: Contribution to journalArticle

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