@inproceedings{825e6629b19b4b44913d32178c504eb1,
title = "Increased latch-up susceptibility of ICs using reverse body bias",
abstract = "― This work presents a previously undocumented cause of latch-up in circuits with reverse body bias capability. This latch-up phenomenon was noticed first during power-on ESD testing. The latch-up risk is determined by the biasing scheme and power delivery network. SPICE simulations are used to confirm the cause and evaluate counter-measures.",
author = "Sandeep Vora and Michael Stockinger and Elyse Rosenbaum",
note = "Publisher Copyright: {\textcopyright} 2020 ESD Association. All rights reserved.; 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2020 ; Conference date: 13-09-2020 Through 18-09-2020",
year = "2020",
month = sep,
day = "13",
language = "English (US)",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
publisher = "ESD Association",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020",
}