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Incident-mass dependence of temperature-enhanced ion-induced sputtering in liquid metals
M. D. Coventry,
D. N. Ruzic
Nuclear, Plasma, and Radiological Engineering
Micro and Nanotechnology Lab
Office of the Provost
Electrical and Computer Engineering
Biomedical and Translational Sciences
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Keyphrases
Mass Dependence
100%
Ion Bombardment
100%
Liquid Metal
100%
Ion-induced
100%
Sputtering Yield
66%
Heavy Ions
66%
Light Ions
66%
High Purity
33%
Ar Ions
33%
Temperature Effect
33%
Ion Irradiation
33%
Atomistic Simulation
33%
Monte Carlo
33%
Time Measurement
33%
Quartz Crystal Microbalance with Dissipation (QCM-D)
33%
Sample Temperature
33%
Oblique Incidence
33%
Liquid Tin
33%
Engineering
Ion Implantation
100%
Liquid Metal
100%
Sputtering Yield
66%
Data Show
33%
Experimental Result
33%
Atomistic Simulation
33%
Quartz Crystal Microbalance
33%
Measurement Time
33%
Sample Temperature
33%
Oblique Incidence
33%
Material Science
Ion Implantation
100%
Liquid Metal
100%
Tin
66%