In situ uniaxial mechanical testing of small scale materials - A review

Wonmo Kang, Jagannathan Rajagopalan, M Taher A Saif

Research output: Contribution to journalReview article

Abstract

Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.

Original languageEnglish (US)
Pages (from-to)282-287
Number of pages6
JournalNanoscience and Nanotechnology Letters
Volume2
Issue number4
DOIs
StatePublished - Dec 2010

Fingerprint

Mechanical testing
Mechanical properties
Testing

Keywords

  • Electron microscopy
  • In situ uniaxial test
  • Micro/nanomaterials
  • Microelectromechanical devices
  • Thin film

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

In situ uniaxial mechanical testing of small scale materials - A review. / Kang, Wonmo; Rajagopalan, Jagannathan; Saif, M Taher A.

In: Nanoscience and Nanotechnology Letters, Vol. 2, No. 4, 12.2010, p. 282-287.

Research output: Contribution to journalReview article

@article{489a9b5618e94b32a2504f6dc90a5f31,
title = "In situ uniaxial mechanical testing of small scale materials - A review",
abstract = "Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.",
keywords = "Electron microscopy, In situ uniaxial test, Micro/nanomaterials, Microelectromechanical devices, Thin film",
author = "Wonmo Kang and Jagannathan Rajagopalan and Saif, {M Taher A}",
year = "2010",
month = "12",
doi = "10.1166/nnl.2010.1107",
language = "English (US)",
volume = "2",
pages = "282--287",
journal = "Nanoscience and Nanotechnology Letters",
issn = "1941-4900",
publisher = "American Scientific Publishers",
number = "4",

}

TY - JOUR

T1 - In situ uniaxial mechanical testing of small scale materials - A review

AU - Kang, Wonmo

AU - Rajagopalan, Jagannathan

AU - Saif, M Taher A

PY - 2010/12

Y1 - 2010/12

N2 - Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.

AB - Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.

KW - Electron microscopy

KW - In situ uniaxial test

KW - Micro/nanomaterials

KW - Microelectromechanical devices

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=79952383627&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79952383627&partnerID=8YFLogxK

U2 - 10.1166/nnl.2010.1107

DO - 10.1166/nnl.2010.1107

M3 - Review article

AN - SCOPUS:79952383627

VL - 2

SP - 282

EP - 287

JO - Nanoscience and Nanotechnology Letters

JF - Nanoscience and Nanotechnology Letters

SN - 1941-4900

IS - 4

ER -