In situ uniaxial mechanical testing of small scale materials - A review

Wonmo Kang, Jagannathan Rajagopalan, M. Taher A. Saif

Research output: Contribution to journalReview articlepeer-review

Abstract

Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.

Original languageEnglish (US)
Pages (from-to)282-287
Number of pages6
JournalNanoscience and Nanotechnology Letters
Volume2
Issue number4
DOIs
StatePublished - Dec 2010

Keywords

  • Electron microscopy
  • In situ uniaxial test
  • Micro/nanomaterials
  • Microelectromechanical devices
  • Thin film

ASJC Scopus subject areas

  • Materials Science(all)

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