Abstract
In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3-0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3732-3734 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 76 |
| Issue number | 25 |
| DOIs | |
| State | Published - Jun 19 2000 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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