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In situ transmission electron microscopy study of electric-field-induced microcracking in single crystal Pb(Mg1/3Nb2/3)O3-PbTiO3

  • Z. Xu
  • , X. Tan
  • , P. Han
  • , J. K. Shang

Research output: Contribution to journalArticlepeer-review

Abstract

In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3-0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described.

Original languageEnglish (US)
Pages (from-to)3732-3734
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number25
DOIs
StatePublished - Jun 19 2000

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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