In-situ transmission electron microscopy study of electric-field-induced grain-boundary cracking in lead zirconate titanate

Xiaoli Tan, Jian Ku Shang

Research output: Contribution to journalArticlepeer-review

Abstract

The field-driven in-situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of field-induced cracking in ferroelectric ceramics. The technique was constructed by combining a selectively deposited thin film electrode configuration with a modified hot stage to deliver a required electric voltage to a ferroelectric TEM specimen. Under cyclic electric fields, microcracks were found to initiate from pores at the triple junctions and propagate along the grain-boundary in a lead zirconate titanate (PZT) ceramic. Grain-boundary cavitation and coalescence of microcracks were directly observed for the first time during field-induced fracture of PZT at room temperature. The results suggest that dielectric breakdown of the grain-boundary phase was conducive to grain-boundary cavitation, and the crack growth followed the progressive accumulation of the cavity density with electric cycling.

Original languageEnglish (US)
Pages (from-to)1463-1478
Number of pages16
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume82
Issue number8
DOIs
StatePublished - May 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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