In situ transmission electron microscopy observations of toughening mechanisms in ultra-fine grained columnar aluminum thin films

K. Hattar; J. Han; M. T.A. Saif; Ian M. Robertson

doi:10.1557/JMR.2005.0233

In situ transmission electron microscopy observations of toughening mechanisms in ultra-fine grained columnar aluminum thin films

K. Hattar, J. Han, M. T.A. Saif, Ian M. Robertson

Research output: Contribution to journal › Article › peer-review

Abstract

A unique straining device, fabricated using microlithographic techniques, has been developed to permit real-time investigation in the transmission electron microscope (TEM) of the deformation and failure mechanisms in ultrafine-grained aluminum. The tensile specimen is a freestanding thin film with a columnar microstructure that has a uniform cross-section (100 × 0.125 μm) and a gauge length of 300 μm. In situ TEM straining experiments show the fracture mode is intergranular with no accompanying general plasticity. Propagating cracks were halted at large grains, and crack blunting occurred through grain-boundary-mediated processes. The blunting process was accompanied by dislocation emission and deformation twinning in the grain responsible for arresting the crack. Voids or microcracks nucleated and grew on grain boundaries ahead of the arrested crack, and crack advance occurred through linkage of the microcracks and the primary crack.

Original language	English (US)
Pages (from-to)	1869-1877
Number of pages	9
Journal	Journal of Materials Research
Volume	20
Issue number	7
DOIs	https://doi.org/10.1557/JMR.2005.0233
State	Published - Jul 2005

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/JMR.2005.0233

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@article{37192e2c69c74deda74267e90d96df3d,

title = "In situ transmission electron microscopy observations of toughening mechanisms in ultra-fine grained columnar aluminum thin films",

abstract = "A unique straining device, fabricated using microlithographic techniques, has been developed to permit real-time investigation in the transmission electron microscope (TEM) of the deformation and failure mechanisms in ultrafine-grained aluminum. The tensile specimen is a freestanding thin film with a columnar microstructure that has a uniform cross-section (100 × 0.125 μm) and a gauge length of 300 μm. In situ TEM straining experiments show the fracture mode is intergranular with no accompanying general plasticity. Propagating cracks were halted at large grains, and crack blunting occurred through grain-boundary-mediated processes. The blunting process was accompanied by dislocation emission and deformation twinning in the grain responsible for arresting the crack. Voids or microcracks nucleated and grew on grain boundaries ahead of the arrested crack, and crack advance occurred through linkage of the microcracks and the primary crack.",

author = "K. Hattar and J. Han and Saif, {M. T.A.} and Robertson, {Ian M.}",

note = "Funding Information: This research was supported by a grant from National Science Foundation Division of Materials Research, Award No. 02037400. The devices were fabricated in the Micro-Miniature Systems Laboratory of the Department of Mechanical & Industrial Engineering and the Micro and Nanotechnology Laboratory at University of Illinois at Urbana Champaign. Research for this publication was carried out in the Center for Microanalysis of Materials, University of Illinois at Urbana-Champaign, which is partially supported by the United States Department of Energy under Grant No. DEFG02-91-ER45439",

year = "2005",

month = jul,

doi = "10.1557/JMR.2005.0233",

language = "English (US)",

volume = "20",

pages = "1869--1877",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Springer International Publishing AG",

number = "7",

}

TY - JOUR

T1 - In situ transmission electron microscopy observations of toughening mechanisms in ultra-fine grained columnar aluminum thin films

AU - Hattar, K.

AU - Han, J.

AU - Saif, M. T.A.

AU - Robertson, Ian M.

N1 - Funding Information: This research was supported by a grant from National Science Foundation Division of Materials Research, Award No. 02037400. The devices were fabricated in the Micro-Miniature Systems Laboratory of the Department of Mechanical & Industrial Engineering and the Micro and Nanotechnology Laboratory at University of Illinois at Urbana Champaign. Research for this publication was carried out in the Center for Microanalysis of Materials, University of Illinois at Urbana-Champaign, which is partially supported by the United States Department of Energy under Grant No. DEFG02-91-ER45439

PY - 2005/7

Y1 - 2005/7

N2 - A unique straining device, fabricated using microlithographic techniques, has been developed to permit real-time investigation in the transmission electron microscope (TEM) of the deformation and failure mechanisms in ultrafine-grained aluminum. The tensile specimen is a freestanding thin film with a columnar microstructure that has a uniform cross-section (100 × 0.125 μm) and a gauge length of 300 μm. In situ TEM straining experiments show the fracture mode is intergranular with no accompanying general plasticity. Propagating cracks were halted at large grains, and crack blunting occurred through grain-boundary-mediated processes. The blunting process was accompanied by dislocation emission and deformation twinning in the grain responsible for arresting the crack. Voids or microcracks nucleated and grew on grain boundaries ahead of the arrested crack, and crack advance occurred through linkage of the microcracks and the primary crack.

AB - A unique straining device, fabricated using microlithographic techniques, has been developed to permit real-time investigation in the transmission electron microscope (TEM) of the deformation and failure mechanisms in ultrafine-grained aluminum. The tensile specimen is a freestanding thin film with a columnar microstructure that has a uniform cross-section (100 × 0.125 μm) and a gauge length of 300 μm. In situ TEM straining experiments show the fracture mode is intergranular with no accompanying general plasticity. Propagating cracks were halted at large grains, and crack blunting occurred through grain-boundary-mediated processes. The blunting process was accompanied by dislocation emission and deformation twinning in the grain responsible for arresting the crack. Voids or microcracks nucleated and grew on grain boundaries ahead of the arrested crack, and crack advance occurred through linkage of the microcracks and the primary crack.

UR - http://www.scopus.com/inward/record.url?scp=29144437822&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=29144437822&partnerID=8YFLogxK

U2 - 10.1557/JMR.2005.0233

DO - 10.1557/JMR.2005.0233

M3 - Article

AN - SCOPUS:29144437822

SN - 0884-2914

VL - 20

SP - 1869

EP - 1877

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 7

ER -

In situ transmission electron microscopy observations of toughening mechanisms in ultra-fine grained columnar aluminum thin films

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