In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

Xiaoli Tan; Zhengkui Xu; Jian Ku Shang

doi:10.1016/S0921-5093(00)01911-0

In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

Xiaoli Tan, Zhengkui Xu, Jian Ku Shang

Research output: Contribution to journal › Article › peer-review

Abstract

In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles, microcracks were found to develop along domain and grain boundaries.

Original language	English (US)
Pages (from-to)	157-161
Number of pages	5
Journal	Materials Science and Engineering: A
Volume	314
Issue number	1-2
DOIs	https://doi.org/10.1016/S0921-5093(00)01911-0
State	Published - Sep 15 2001
Externally published	Yes

Keywords

Domain switching
Ferroelectric ceramics
In situ TEM
Microcrack
PZT

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Online availability

10.1016/S0921-5093(00)01911-0

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title = "In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics",

abstract = "In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles, microcracks were found to develop along domain and grain boundaries.",

keywords = "Domain switching, Ferroelectric ceramics, In situ TEM, Microcrack, PZT",

author = "Xiaoli Tan and Zhengkui Xu and Shang, {Jian Ku}",

note = "Funding Information: The authors would like to thank Professor D. Payne, Dr Y. Kim and Dr R. Twesten for stimulating discussion and suggestions. This study was supported by the Army Research Office through contract DAAH04-96-1-0373.",

year = "2001",

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day = "15",

doi = "10.1016/S0921-5093(00)01911-0",

language = "English (US)",

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pages = "157--161",

journal = "Materials Science and Engineering: A",

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T1 - In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

AU - Tan, Xiaoli

AU - Xu, Zhengkui

AU - Shang, Jian Ku

N1 - Funding Information: The authors would like to thank Professor D. Payne, Dr Y. Kim and Dr R. Twesten for stimulating discussion and suggestions. This study was supported by the Army Research Office through contract DAAH04-96-1-0373.

PY - 2001/9/15

Y1 - 2001/9/15

N2 - In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles, microcracks were found to develop along domain and grain boundaries.

AB - In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles, microcracks were found to develop along domain and grain boundaries.

KW - Domain switching

KW - Ferroelectric ceramics

KW - In situ TEM

KW - Microcrack

KW - PZT

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JF - Materials Science and Engineering: A

IS - 1-2

ER -

In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

Abstract

Keywords

ASJC Scopus subject areas

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