In-situ synchrotron X-ray study of the elevated temperature deformation response of SS 316L pressurized creep tubes

Kun Mo, Hsiao Ming Tung, Xiang Chen, Di Yun, Yinbin Miao, Weiying Chen, Jonathan Aimer, April Novak, James F. Stubbins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A high-energy diffraction technique is presented that uses synchrotron X-rays to characterize the in situ deformation response of pressurized creep tubes at elevated temperature. In addition to the X-ray diffraction measurement, the technique allows the macroscopic creep strain to be measured simultaneously during X-ray exposure. We demonstrated this technique in two areas at different temperatures in the tube specimen. From the X-ray diffraction patterns, we obtained a typical creep curve with identifiable secondary and tertiary creep response at the high temperature area, and only observed the secondary creep response at the low temperature area. The diffraction peak broadening analysis directly showed the development of the dislocation structures and lattice strain during deformation and make it possible to track the development of creep void nucleation, growth and coalescence.

Original languageEnglish (US)
Title of host publicationSmall Specimen Test Techniques
Subtitle of host publication6th Volume
EditorsEnrico Lucon, Mikhail A. Sokolov
PublisherASTM International
Pages244-255
Number of pages12
ISBN (Electronic)9780803175976
DOIs
StatePublished - 2015
Event6th International Symposium on Small Specimen Test Techniques - Houston, United States
Duration: Jan 29 2014Jan 31 2014

Publication series

NameASTM Special Technical Publication
VolumeSTP 1576
ISSN (Print)0066-0558

Other

Other6th International Symposium on Small Specimen Test Techniques
Country/TerritoryUnited States
CityHouston
Period1/29/141/31/14

Keywords

  • Creep
  • Pressurized creep tubes
  • Synchrotron radiation

ASJC Scopus subject areas

  • General Materials Science

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