In-situ Surface Characterization of Mechanical and Electronic Behavior During Ion-Induced Nanostructure Synthesis

Daniel Lawrence. Rokusek, Christopher R. Wagener, Martin Nieto-perez, Jean Allain

Research output: Contribution to conferenceOther

Original languageEnglish (US)
DOIs
StatePublished - 2008

Cite this

In-situ Surface Characterization of Mechanical and Electronic Behavior During Ion-Induced Nanostructure Synthesis. / Rokusek, Daniel Lawrence.; Wagener, Christopher R.; Nieto-perez, Martin; Allain, Jean.

2008.

Research output: Contribution to conferenceOther

Rokusek, Daniel Lawrence. ; Wagener, Christopher R. ; Nieto-perez, Martin ; Allain, Jean. / In-situ Surface Characterization of Mechanical and Electronic Behavior During Ion-Induced Nanostructure Synthesis.
@conference{4486a85151f04ae88a4e8786dd01a612,
title = "In-situ Surface Characterization of Mechanical and Electronic Behavior During Ion-Induced Nanostructure Synthesis",
author = "Rokusek, {Daniel Lawrence.} and Wagener, {Christopher R.} and Martin Nieto-perez and Jean Allain",
year = "2008",
doi = "10.1557/PROC-1137-EE05-16",
language = "English (US)",

}

TY - CONF

T1 - In-situ Surface Characterization of Mechanical and Electronic Behavior During Ion-Induced Nanostructure Synthesis

AU - Rokusek, Daniel Lawrence.

AU - Wagener, Christopher R.

AU - Nieto-perez, Martin

AU - Allain, Jean

PY - 2008

Y1 - 2008

U2 - 10.1557/PROC-1137-EE05-16

DO - 10.1557/PROC-1137-EE05-16

M3 - Other

ER -