In situ Rutherford backscattering analysis of radiation-induced segregation

R. S. Averback; L. E. Rehn; W. Wagner; P. R. Okamoto; H. Wiedersich

doi:10.1016/0029-554X(82)90564-X

In situ Rutherford backscattering analysis of radiation-induced segregation

R. S. Averback, L. E. Rehn, W. Wagner, P. R. Okamoto, H. Wiedersich

Research output: Contribution to journal › Article › peer-review

Abstract

Radiation-induced segregation of Ni-12.7 at.% Si during 2.0 MeV He and 3.25 MeV Kr irradiation has been investigated. Using high resolution Rutherford backscattering spectrometry, the rate of segregation of Si at the irradiated surface was determined. During the He irradiation, the amount of Si segregation was found to be proportional to the square root of the dose. From the dependence of segregation on temperature, for both He and Kr irradiations, an apparent activation enthalpy of 0.3 eV was deduced for the segregation process. A comparison of the segregation rates during the He and Kr irradiations revealed that on the basis of calculated dpa rates, He irradiation is significantly (∼6 ×) more effective than Kr irradiation for inducing segregation.

Original language	English (US)
Pages (from-to)	457-460
Number of pages	4
Journal	Nuclear Instruments and Methods
Volume	194
Issue number	1-3
DOIs	https://doi.org/10.1016/0029-554X(82)90564-X
State	Published - Mar 15 1982
Externally published	Yes

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title = "In situ Rutherford backscattering analysis of radiation-induced segregation",

abstract = "Radiation-induced segregation of Ni-12.7 at.% Si during 2.0 MeV He and 3.25 MeV Kr irradiation has been investigated. Using high resolution Rutherford backscattering spectrometry, the rate of segregation of Si at the irradiated surface was determined. During the He irradiation, the amount of Si segregation was found to be proportional to the square root of the dose. From the dependence of segregation on temperature, for both He and Kr irradiations, an apparent activation enthalpy of 0.3 eV was deduced for the segregation process. A comparison of the segregation rates during the He and Kr irradiations revealed that on the basis of calculated dpa rates, He irradiation is significantly (∼6 ×) more effective than Kr irradiation for inducing segregation.",

author = "Averback, {R. S.} and Rehn, {L. E.} and W. Wagner and Okamoto, {P. R.} and H. Wiedersich",

note = "Funding Information: * Work supported by the US Department of Energy.",

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doi = "10.1016/0029-554X(82)90564-X",

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T1 - In situ Rutherford backscattering analysis of radiation-induced segregation

AU - Averback, R. S.

AU - Rehn, L. E.

AU - Wagner, W.

AU - Okamoto, P. R.

AU - Wiedersich, H.

N1 - Funding Information: * Work supported by the US Department of Energy.

PY - 1982/3/15

Y1 - 1982/3/15

N2 - Radiation-induced segregation of Ni-12.7 at.% Si during 2.0 MeV He and 3.25 MeV Kr irradiation has been investigated. Using high resolution Rutherford backscattering spectrometry, the rate of segregation of Si at the irradiated surface was determined. During the He irradiation, the amount of Si segregation was found to be proportional to the square root of the dose. From the dependence of segregation on temperature, for both He and Kr irradiations, an apparent activation enthalpy of 0.3 eV was deduced for the segregation process. A comparison of the segregation rates during the He and Kr irradiations revealed that on the basis of calculated dpa rates, He irradiation is significantly (∼6 ×) more effective than Kr irradiation for inducing segregation.

AB - Radiation-induced segregation of Ni-12.7 at.% Si during 2.0 MeV He and 3.25 MeV Kr irradiation has been investigated. Using high resolution Rutherford backscattering spectrometry, the rate of segregation of Si at the irradiated surface was determined. During the He irradiation, the amount of Si segregation was found to be proportional to the square root of the dose. From the dependence of segregation on temperature, for both He and Kr irradiations, an apparent activation enthalpy of 0.3 eV was deduced for the segregation process. A comparison of the segregation rates during the He and Kr irradiations revealed that on the basis of calculated dpa rates, He irradiation is significantly (∼6 ×) more effective than Kr irradiation for inducing segregation.

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In situ Rutherford backscattering analysis of radiation-induced segregation

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