TY - GEN
T1 - In Situ Power Loss Estimation of IGBT Power Modules
AU - Jin, Qichen
AU - Mendizabal, Johannes K.
AU - Miljkovic, Nenad
AU - Banerjee, Arijit
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/5/17
Y1 - 2021/5/17
N2 - A fault detection and prediction method of insulated-gate bipolar transistor (IGBT) has been improved over the past decades to reduce system down time. In situ lifetime estimation of IGBT modules has been challenging due to a number of requirements: necessity to operate at high-voltage in the switching environment, measurement precision of the gate-threshold voltage or collector-to-emitter voltage. This paper presents a wear-fatigue estimation framework that consists of collector-to-emitter measurement, power loss calculation and thermal lifetime prediction model. The measurement circuit enables the estimation of power loss across a variety of IGBT modules with minimum impact on system reliability.
AB - A fault detection and prediction method of insulated-gate bipolar transistor (IGBT) has been improved over the past decades to reduce system down time. In situ lifetime estimation of IGBT modules has been challenging due to a number of requirements: necessity to operate at high-voltage in the switching environment, measurement precision of the gate-threshold voltage or collector-to-emitter voltage. This paper presents a wear-fatigue estimation framework that consists of collector-to-emitter measurement, power loss calculation and thermal lifetime prediction model. The measurement circuit enables the estimation of power loss across a variety of IGBT modules with minimum impact on system reliability.
UR - http://www.scopus.com/inward/record.url?scp=85112798204&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85112798204&partnerID=8YFLogxK
U2 - 10.1109/IEMDC47953.2021.9449570
DO - 10.1109/IEMDC47953.2021.9449570
M3 - Conference contribution
AN - SCOPUS:85112798204
T3 - 2021 IEEE International Electric Machines and Drives Conference, IEMDC 2021
BT - 2021 IEEE International Electric Machines and Drives Conference, IEMDC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE International Electric Machines and Drives Conference, IEMDC 2021
Y2 - 17 May 2021 through 20 May 2021
ER -