In-situ measurements of nanoscale phenomena using diffraction phase microscopy

Chris Edwards, Steven J. McKeown, Suk Won Hwang, Paul J. Froeter, Xiuling Li, John A Rogers, Gabriel Popescu, Lynford L Goddard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we present recent results on several novel applications including optically monitoring the dissolution of biodegradable materials proposed for use in biological electronic implants, the self-assembly of microtubes during semiconductor etching, and the expansion and deformation of palladium structures for use in hydrogen sensing applications. The measurements are done using diffraction phase microscopy (DPM), a quantitative phase imaging (QPI) technique, which uses the phase of the imaging field to reconstruct a map of the sample's surface. It combines off-axis and common-path geometries allowing for single-shot, high-speed dynamics with sub-nanometer noise levels.

Original languageEnglish (US)
Title of host publicationQuantitative Phase Imaging
EditorsYongKeun Park, Gabriel Popescu
PublisherSPIE
ISBN (Electronic)9781628414264
DOIs
StatePublished - Jan 1 2015
Event1st Conference on Quantitative Phase Imaging, QPI 2015 - San Francisco, United States
Duration: Feb 7 2015Feb 10 2015

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume9336
ISSN (Print)1605-7422

Other

Other1st Conference on Quantitative Phase Imaging, QPI 2015
CountryUnited States
CitySan Francisco
Period2/7/152/10/15

Keywords

  • biodegradable electronics
  • diffraction phase microscopy
  • interferometric microscopy
  • material deformation
  • material expansion
  • microtubes
  • nanotubes
  • optical inspection
  • quantitative phase imaging
  • self-assembly

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Biomaterials
  • Radiology Nuclear Medicine and imaging

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  • Cite this

    Edwards, C., McKeown, S. J., Hwang, S. W., Froeter, P. J., Li, X., Rogers, J. A., Popescu, G., & Goddard, L. L. (2015). In-situ measurements of nanoscale phenomena using diffraction phase microscopy. In Y. Park, & G. Popescu (Eds.), Quantitative Phase Imaging [93361K] (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; Vol. 9336). SPIE. https://doi.org/10.1117/12.2080253