In situ energy-dispersive X-ray diffraction of local phase dynamics during solvothermal growth of Cu4O3

Zhelong Jiang, Jai Sharma, John S. Okasinski, Haiyan Chen, Daniel P. Shoemaker

Research output: Contribution to journalArticlepeer-review

Abstract

Using in situ methods to characterize the state of a system during reactions is critical to understanding and improving solvothermal syntheses. This work demonstrates the use of in situ energy-dispersive X-ray diffraction (EDXRD) to investigate the local dynamics during solvothermal formation of Cu4O3 using a general-purpose full-sized laboratory oven. This allows for direct comparison of in situ data with laboratory-based reactions. Using in situ EDXRD, changes in the local amounts of Cu4O3, Cu2O and CuO within approximately 100 × 100 × 700μm gauge volumes during solvothermal Cu4O3 formation were recorded. Fast conversion between Cu2O and CuO was observed in the solvothermal environment, whereas Cu4O3 was found to be chemically stable against disturbances once formed. The observed differences in local dynamics give further support to the differences in formation mechanisms between Cu4O3 and Cu2O/CuO proposed here.

Original languageEnglish (US)
Pages (from-to)42-53
Number of pages12
JournalJournal of Applied Crystallography
Volume54
DOIs
StatePublished - Feb 1 2021

Keywords

  • Cu4O3
  • energy-dispersive X-ray diffraction
  • in situ kinetics
  • phase conversion.
  • solvothermal synthesis

ASJC Scopus subject areas

  • General Biochemistry, Genetics and Molecular Biology

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