We report on the development of an in situ micropillar compression apparatus capable of measuring creep under heavy ion beam irradiation. The apparatus has a force resolution of 1 μN and a displacement resolution of 1 nm. The experimental setup consists of a nanopositioner, a laser displacement sensor, and a microfabricated doubly clamped silicon-beam transducer. The system was tested by measuring the creep rate of amorphous Cu56Ti 38Ag6 micropillars as a function of applied stress during room temperature irradiation with 2.1 MeV Ne+. Measured values of the irradiation induced fluidity are in the range 0.5-3 dpa-1 GPa -1, and in good agreement with values obtained by stress relaxation experiments on other metallic glasses, and with predictions of molecular dynamics simulations. The in situ apparatus provides a practical approach for accelerated evaluation of irradiation induced creep in promising nuclear materials.

Original languageEnglish (US)
Pages (from-to)104-110
Number of pages7
JournalJournal of Nuclear Materials
Issue number1-3
StatePublished - Aug 2014

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering


Dive into the research topics of 'In situ creep measurements on micropillar samples during heavy ion irradiation'. Together they form a unique fingerprint.

Cite this