A method to perform fast transient simulations of interconnects by modelling the impulse responses of the S-parameters as discrete impulses, and then retaining only those with significant magnitudes has recently been shown to be faster than the present state-of-the-art method of curve fitting to a rational function model. An improvement to the fast convolution method by first optimising the choice of reference impedance used in the dataset is proposed. The method is seen to yield computational savings while retaining the accuracy.
ASJC Scopus subject areas
- Electrical and Electronic Engineering