Abstract
The improved performance of AlGaN/GaN heterojunction field-effect transistors using a delta-doping approach along with an AlN binary barrier is reported. Low-pressure metalorganic chemical vapor deposition was used to grow the epitaxial heterostructures on semi-insulating SiC substrates. The maximum carrier mobility of μ = 1,066 cm2/V-s and sheet carrier density of ns ∼ 2.30 × 1013 cm-2 yields a large nsμ product of 2.45 × 1016 V-s. Devices with 0.15 μm gate lengths exhibited a maximum current density of IDSmax = 1.82 A/mm (at VG = +1 V) and a peak transconductance of gm = 331 mS/mm. Furthermore, fT ∼ 55 GHz and fmax ∼ 115 GHz were measured.
Original language | English (US) |
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Pages (from-to) | L353-L355 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 42 |
Issue number | 4 A |
DOIs | |
State | Published - Apr 1 2003 |
Keywords
- Delta doping
- Gallium nitride
- HEMT
- HFET
- High electron mobility transistors
- MOCVD growth
ASJC Scopus subject areas
- General Engineering
- General Physics and Astronomy