Abstract
This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processor, such as the MasPar. The proposed approach improves over a previous approach [12] in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.
Original language | English (US) |
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Pages (from-to) | 137-145 |
Number of pages | 9 |
Journal | IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems |
State | Published - 1995 |
Event | Proceedings of the 1995 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, DFT'95 - Lafayette, LA, USA Duration: Nov 13 1995 → Nov 15 1995 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering