Improved approach to fault tolerant rank order filtering on a SIMD mesh processor

Jai Hoon Kim, Fabrizio Lombardi, Nitin H. Vaidya

Research output: Contribution to journalConference articlepeer-review

Abstract

This paper presents an approach for the fault tolerant computation of the rank order filtering on a SIMD (Single Instruction Multiple Data) mesh processor, such as the MasPar. The proposed approach improves over a previous approach [12] in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty PEs as computed by neighboring (fault free) processing elements (PEs), a lower distortion can be achieved for enhancement of the image.

Original languageEnglish (US)
Pages (from-to)137-145
Number of pages9
JournalIEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
StatePublished - 1995
EventProceedings of the 1995 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, DFT'95 - Lafayette, LA, USA
Duration: Nov 13 1995Nov 15 1995

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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