Implications of waveform and thickness dependence of SiO₂ breakdown on accelerated testing

Keyphrases

• Silica 100%
• Thickness Dependence 100%
• Accelerated Testing 100%
• Oxides 66%
• Pulse Stress 66%
• Normal Operating Conditions 66%
• High Electric Field 33%
• Bipolar Pulse 33%
• Cycle Lifetime 33%
• Hole Trapping 33%
• Duty Cycle 33%
• Oxide Breakdown 33%
• Unipolar Pulses 33%
• Lifetime Degradation 33%
• Breakdown Characteristics 33%

Engineering

• Stress Pulse 100%
• Normal Operating Condition 100%
• Silicon Dioxide 100%
• Test Condition 50%
• High Electric Field 50%
• Duty Cycle 50%
• Accelerated Test 50%