Imaging suspended carbon nanotubes in field-effect transistors configured with microfabricated slits for transmission electron microscopy

Taekyung Kim, Jian Min Zuo, Eric A. Olson, Ivan Petrov

Research output: Contribution to journalArticle

Abstract

Field-effect transistors with carbon nanotubes (CNTs) suspended across etched slits and fabricated by chemical vapor deposition have been characterized by electrical measurements and transmission electron microscopy. Two devices are examined here: One is semiconducting from two single-wall CNTs, and the other is semiconducting and metallic, with a large off current, that comes from multiple nanotubes. The study highlights the importance of structural characterization in understanding the performance of CNT devices.

Original languageEnglish (US)
Article number173108
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number17
DOIs
StatePublished - Oct 24 2005

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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