Imaging of micro- and nano-structures with hard X-rays

C. Rau; V. Crecea; C. P. Richter; K. M. Peterson; P. R. Jemian; U. Neuhäusler; G. Schneider; X. Yu; P. V. Braun; T. C. Chiang; I. K. Robinson

doi:10.1049/mnl:20065060

Imaging of micro- and nano-structures with hard X-rays

C. Rau, V. Crecea, C. P. Richter, K. M. Peterson, P. R. Jemian, U. Neuhäusler, G. Schneider, X. Yu, P. V. Braun, T. C. Chiang, I. K. Robinson

Research output: Contribution to journal › Article › peer-review

Abstract

Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

Original language	English (US)
Pages (from-to)	1-5
Number of pages	5
Journal	Micro and Nano Letters
Volume	2
Issue number	1
DOIs	https://doi.org/10.1049/mnl:20065060
State	Published - 2007

ASJC Scopus subject areas

Bioengineering
Biomedical Engineering
General Materials Science
Condensed Matter Physics

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10.1049/mnl:20065060

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abstract = "Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.",

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AU - Rau, C.

AU - Crecea, V.

AU - Richter, C. P.

AU - Peterson, K. M.

AU - Jemian, P. R.

AU - Neuhäusler, U.

AU - Schneider, G.

AU - Yu, X.

AU - Braun, P. V.

AU - Chiang, T. C.

AU - Robinson, I. K.

PY - 2007

Y1 - 2007

N2 - Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

AB - Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

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Imaging of micro- and nano-structures with hard X-rays

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