Imaging-free, few-shot, three-dimensional focusing on point-like emitters in confocal microscopy

Swetapadma Sahoo, Junyue Jiang, Jaden Li, Kieran Loehr, Chad E. Germany, Jincheng Zhou, Bryan K. Clark, Simeon I. Bogdanov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We introduce a rapid, noise-robust, three-dimensional focusing framework for as-is confocal microscopes. We show automated real-time focusing on nanoscale emitters for SNR down to 1, and position tracking with a precision below 10 nm.

Original languageEnglish (US)
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171395
DOIs
StatePublished - 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: May 7 2024May 10 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period5/7/245/10/24

Keywords

  • Electro-optical waveguides
  • Focusing
  • Laser noise
  • Lasers and electrooptics
  • Microscopy
  • Nanoscale devices
  • Noise robustness
  • Real-time systems
  • Signal to noise ratio

ASJC Scopus subject areas

  • Process Chemistry and Technology
  • Computer Networks and Communications
  • Civil and Structural Engineering
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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