Imaging Charged Domain Walls in van der Waals Ferroelectric α-In2Se3 via 4D-STEM

Gillian Nolan, Edmund Han, Shahriar Muhammad Nahid, Arend M. van der Zande, André Schleife, Pinshane Huang

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1644-1645
Number of pages2
JournalMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume29
Issue number1
DOIs
StatePublished - Jul 22 2023

ASJC Scopus subject areas

  • Instrumentation

Cite this