Image reconstruction from TE scattering data using strong permittivity fluctuation theory

J. L. Ma, W. C. Chew, C. C. Lu, J. M. Song

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Compared to the TM case, the inverse scattering problem for the TE incident field is more complicated, due to its stronger nonlinearity. This work provides an effective method for the reconstruction of 2D inhomogeneous dielectric objects from TE scattering data. The algorithm is the combination of the distorted Born iterative method and strong permittivity fluctuation theory. Numerical simulations are performed and the results show that the distorted Born iterative method for strong permittivity fluctuation (SPF-DBIM) converges faster and can obtain better reconstructions for objects with larger dimensions and higher contrast in comparison with the ordinary distorted Born iterative method (DBIM). A frequency hopping technique is also applied to further increase the contrast.

Original languageEnglish (US)
Title of host publicationIEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas
Subtitle of host publicationGateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages702-705
Number of pages4
ISBN (Print)0780344782, 9780780344785
DOIs
StatePublished - 1998
Event1998 IEEE Antennas and Propagation Society International Symposium, APSURSI 1998 - Atlanta, United States
Duration: Jun 21 1998Jun 26 1998

Publication series

NameIEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting
Volume2

Other

Other1998 IEEE Antennas and Propagation Society International Symposium, APSURSI 1998
CountryUnited States
CityAtlanta
Period6/21/986/26/98

ASJC Scopus subject areas

  • Instrumentation
  • Radiation
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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