Image fusion and subpixel parameter estimation for automated optical inspection of electronic components

James M. Reed, Seth Hutchinson

Research output: Contribution to journalArticlepeer-review

Abstract

We present a new approach to automated optical inspection (AOI) of circular features that combines image fusion with subpixel edge detection and parameter estimation. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. These images are fused to produce a high-resolution image of the features to be inspected. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation. The fitted ellipses are then back-projected into 3-space in order to obtain the sizes of the circular features being inspected, assuming that the depth is known. The method is is accurate, efficient, and easily implemented. We present experimental results for real intensity images of circular features of varying sizes. Our results demonstrate that our algorithm shows greatest improvement over traditional methods in cases where the feature size is small relative to the resolution of the imaging device.

Original languageEnglish (US)
Pages (from-to)346-354
Number of pages9
JournalIEEE Transactions on Industrial Electronics
Volume43
Issue number3
DOIs
StatePublished - 1996

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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