If noise in Cr films from spin-density-wave polarization rotation

N. E. Israeloff, M. B. Weissman, G. A. Garfunkel, Dale J Van Harlingen, J. H. Scofield, A. J. Lucero

Research output: Contribution to journalArticle

Abstract

Measurements were made of the temperature dependence, strain dependence, defect dependence, symmetry properties, and small-sample statistical properties of the large 1f noise in antiferromagnetic Cr films. The results are consistent with a model based on rotations of the polarization of spin-density-wave domains. Spontaneous electronic symmetry-breaking effects are proposed as a new source of 1f noise in some metals.

Original languageEnglish (US)
Pages (from-to)152-155
Number of pages4
JournalPhysical review letters
Volume60
Issue number2
DOIs
StatePublished - Jan 1 1988

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Israeloff, N. E., Weissman, M. B., Garfunkel, G. A., Van Harlingen, D. J., Scofield, J. H., & Lucero, A. J. (1988). If noise in Cr films from spin-density-wave polarization rotation. Physical review letters, 60(2), 152-155. https://doi.org/10.1103/PhysRevLett.60.152