If noise in Cr films from spin-density-wave polarization rotation

N. E. Israeloff, M. B. Weissman, G. A. Garfunkel, D. J. Van Harlingen, J. H. Scofield, A. J. Lucero

Research output: Contribution to journalArticlepeer-review


Measurements were made of the temperature dependence, strain dependence, defect dependence, symmetry properties, and small-sample statistical properties of the large 1f noise in antiferromagnetic Cr films. The results are consistent with a model based on rotations of the polarization of spin-density-wave domains. Spontaneous electronic symmetry-breaking effects are proposed as a new source of 1f noise in some metals.

Original languageEnglish (US)
Pages (from-to)152-155
Number of pages4
JournalPhysical review letters
Issue number2
StatePublished - 1988

ASJC Scopus subject areas

  • General Physics and Astronomy


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