Identifying failure-inducing combinations in a combinatorial test set

Laleh Shikh Gholamhossein Ghandehari, Yu Lei, Tao Xie, Richard Kuhn, Raghu Kacker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A t-way combinatorial test set is designed to detect failures that are triggered by combinations involving no more than t parameters. Assume that we have executed a t-way test set and some tests have failed. A natural question to ask is: What combinations have caused these failures? Identifying such combinations can facilitate the debugging effort, e.g., by reducing the scope of the code that needs to be inspected. In this paper, we present an approach to identifying failure-inducing combinations, i.e., combinations that have caused some tests to fail. Given a t-way test set, our approach first identifies and ranks a set of suspicious combinations, which are candidates that are likely to be failure-inducing combinations. Next, it generates a set of new tests, which can be executed to refine the ranking of suspicious combinations in the next iteration. This process can be repeated until a stopping condition is satisfied. We conducted an experiment in which our approach was applied to several benchmark programs. The experimental results show that our approach can effectively and efficiently identify failure-inducing combinations in these programs.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012
Pages370-379
Number of pages10
DOIs
StatePublished - Jun 21 2012
Externally publishedYes
Event5th IEEE International Conference on Software Testing, Verification and Validation, ICST 2012 - Montreal, QC, Canada
Duration: Apr 17 2012Apr 21 2012

Publication series

NameProceedings - IEEE 5th International Conference on Software Testing, Verification and Validation, ICST 2012

Other

Other5th IEEE International Conference on Software Testing, Verification and Validation, ICST 2012
CountryCanada
CityMontreal, QC
Period4/17/124/21/12

Keywords

  • Combinatorial Testing
  • Debugging
  • Fault Localization

ASJC Scopus subject areas

  • Software

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