IBIS modeling using latency insertion method (LIM)

Jose E Schutt-Aine, Jilin Tan, Ping Liu, Feras Al-Hawari, Ambrish Varma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents an approach for the transient simulation of I/O buffers described by IBIS models. Using the latency insertion method a formulation can be obtained for the transient behavior of IBIS models and external circuitry. The formulation offers better convergence than traditional Newton-Raphson methods and is therefore more robust. Several computer simulations are performed to validate the method.

Original languageEnglish (US)
Title of host publication2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
Pages97-100
Number of pages4
DOIs
StatePublished - Jul 27 2012
Event2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Sorrento, Italy
Duration: May 13 2012May 16 2012

Publication series

Name2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings

Other

Other2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012
CountryItaly
CitySorrento
Period5/13/125/16/12

ASJC Scopus subject areas

  • Signal Processing

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  • Cite this

    Schutt-Aine, J. E., Tan, J., Liu, P., Al-Hawari, F., & Varma, A. (2012). IBIS modeling using latency insertion method (LIM). In 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings (pp. 97-100). [6222920] (2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings). https://doi.org/10.1109/SaPIW.2012.6222920