TY - GEN
T1 - IBIS modeling using latency insertion method (LIM)
AU - Schutt-Ainé, José E.
AU - Tan, Jilin
AU - Liu, Ping
AU - Al-Hawari, Feras
AU - Varma, Ambrish
PY - 2012
Y1 - 2012
N2 - This paper presents an approach for the transient simulation of I/O buffers described by IBIS models. Using the latency insertion method a formulation can be obtained for the transient behavior of IBIS models and external circuitry. The formulation offers better convergence than traditional Newton-Raphson methods and is therefore more robust. Several computer simulations are performed to validate the method.
AB - This paper presents an approach for the transient simulation of I/O buffers described by IBIS models. Using the latency insertion method a formulation can be obtained for the transient behavior of IBIS models and external circuitry. The formulation offers better convergence than traditional Newton-Raphson methods and is therefore more robust. Several computer simulations are performed to validate the method.
UR - http://www.scopus.com/inward/record.url?scp=84864123225&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84864123225&partnerID=8YFLogxK
U2 - 10.1109/SaPIW.2012.6222920
DO - 10.1109/SaPIW.2012.6222920
M3 - Conference contribution
AN - SCOPUS:84864123225
SN - 9781467315043
T3 - 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
SP - 97
EP - 100
BT - 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012 - Proceedings
T2 - 2012 IEEE 16th Workshop on Signal and Power Integrity, SPI 2012
Y2 - 13 May 2012 through 16 May 2012
ER -