Hydrogen-induced reduction in medium range order of a-Si thin films observed using fluctuation electron microscopy

L. N. Nittala, S. Jayaraman, B. A. Sperling, J. R. Abelson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)802-803
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2004

ASJC Scopus subject areas

  • Instrumentation

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