@inproceedings{a40a3b60075a412f9d42f7e2e7cb11e0,
title = "Hybrid Quick Error Detection (H-QED): Accelerator validation and debug using high-level synthesis princIPles",
abstract = "Post-silicon validation and debug challenges of system-on-chIPs (SoCs) are getting increasingly difficult. As we reach the limits of Dennard scaling, efforts to improve system performance and energy efficiency have resulted in the integration of a wide variety of complex hardware accelerators in SoCs. Hence, it is essential to address post-silicon validation and debug of hardware accelerators. High-level synthesis (HLS) is a promising technique to rapidly create customized hardware accelerators. In this paper, we present the Hybrid Quick Error Detection (H-QED) approach that overcomes post-silicon validation and debug challenges for hardware accelerators by leveraging HLS techniques. H-QED improves error detection latencies (time elapsed from when a bug is activated to when it manifests as an observable failure) by 2 orders of magnitude and bug coverage 3-fold compared to traditional post-silicon validation techniques. H-QED also uncovered previously unknown bugs in the CHStone benchmark suite, which is widely used by the HLS community. H-QED incurs less than 2% chIP-level area overhead with negligible performance impact, and we also introduce techniques to minimize any possible intrusiveness introduced by H-QED.",
keywords = "C simulation, Post-silicon validation, accelerators, high-level synthesis, logic bugs, signature generation, timing errors",
author = "Campbell, {Keith A.} and David Lin and Subhasish Mitra and Deming Chen",
note = "Publisher Copyright: {\textcopyright} 2015 ACM.; 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015 ; Conference date: 07-06-2015 Through 11-06-2015",
year = "2015",
month = jul,
day = "24",
doi = "10.1145/2744769.2744853",
language = "English (US)",
series = "Proceedings - Design Automation Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015",
address = "United States",
}