Abstract
Pure, dense, and stoichiometric MgO thin films have been deposited at temperatures as low as 225 °C by chemical vapor deposition using a recently reported magnesium precursor, magnesium N,N-dimethylaminodiboranate, which has the highest room-temperature vapor pressure among known Mg-containing compounds, with water as a co-reactant. The films are characterized by x-ray photoelectron spectroscopy, atomic force microscopy, scanning electron microscopy, and spectroscopic ellipsometry. Conformal coating on a trench with 35:1 aspect ratio is achieved at a film growth rate of 2 nm/min. The growth rate can be tuned between 2-20 nm/min according to the requirement of the structure to be coated.
Original language | English (US) |
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Article number | 101605 |
Journal | Applied Physics Letters |
Volume | 102 |
Issue number | 10 |
DOIs | |
State | Published - Mar 11 2013 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)