Abstract
A higher order method of moments is presented for the analysis of microstrip structures in a multilayer medium. It is shown that this higher order method has a better convergence rate than the conventional lower order methods. Therefore, to achieve the same accuracy, the higher over method requires fewer unknowns. Several examples are given to demonstrate the accuracy and efficiency of this method.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 141-145 |
| Number of pages | 5 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 20 2000 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering