High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging

R. L. Black; T. Garbowski; C. Bean; A. L. Eberle; S. Nickell; J. C. Stinville

doi:10.1093/mam/ozae044.312

High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging

R. L. Black, T. Garbowski, C. Bean, A. L. Eberle, S. Nickell, J. C. Stinville

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	657-658
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.312
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

ASJC Scopus subject areas

Instrumentation

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10.1093/mam/ozae044.312

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@article{7d189cc6466e4160add723e4c311fde6,

title = "High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging",

author = "Black, {R. L.} and T. Garbowski and C. Bean and Eberle, {A. L.} and S. Nickell and Stinville, {J. C.}",

year = "2024",

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doi = "10.1093/mam/ozae044.312",

language = "English (US)",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging

AU - Black, R. L.

AU - Garbowski, T.

AU - Bean, C.

AU - Eberle, A. L.

AU - Nickell, S.

AU - Stinville, J. C.

PY - 2024/7/24

Y1 - 2024/7/24

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U2 - 10.1093/mam/ozae044.312

DO - 10.1093/mam/ozae044.312

M3 - Conference article

AN - SCOPUS:85215707995

SN - 1431-9276

VL - 30

SP - 657

EP - 658

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging

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