High-temperature piezoresponse force microscopy

B. Bhatia; J. Karthik; D. G. Cahill; L. W. Martin; W. P. King

doi:10.1063/1.3652771

High-temperature piezoresponse force microscopy

B. Bhatia, J. Karthik, D. G. Cahill, L. W. Martin, W. P. King

Research output: Contribution to journal › Article › peer-review

Abstract

We report high temperature piezoresponse force microscopy (PFM) on 100 nm thick PbZr_0.2Ti_0.8O₃ films fabricated on a miniature heater stage. The microfabricated resistive heater allows local temperature control up to 1000 C with minimal electrostatic interactions. The PFM measurements were used to collect piezoelectric hysteresis loops over the temperature range 25-400 C. The piezoresponse increases with temperature and then decreases rapidly near 400 C, which is indicative of ferroelectric- paraelectric phase transition.

Original language	English (US)
Article number	173103
Journal	Applied Physics Letters
Volume	99
Issue number	17
DOIs	https://doi.org/10.1063/1.3652771
State	Published - Oct 24 2011

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3652771

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@article{c9725708141040dbaa17961f3ba5aca1,

title = "High-temperature piezoresponse force microscopy",

abstract = "We report high temperature piezoresponse force microscopy (PFM) on 100 nm thick PbZr0.2Ti0.8O3 films fabricated on a miniature heater stage. The microfabricated resistive heater allows local temperature control up to 1000 C with minimal electrostatic interactions. The PFM measurements were used to collect piezoelectric hysteresis loops over the temperature range 25-400 C. The piezoresponse increases with temperature and then decreases rapidly near 400 C, which is indicative of ferroelectric- paraelectric phase transition.",

author = "B. Bhatia and J. Karthik and Cahill, {D. G.} and Martin, {L. W.} and King, {W. P.}",

note = "Funding Information: The authors acknowledge support from the Office of Naval Research under Grant Number N00014-10-10525. Some work was performed in the Seitz Materials Research Laboratory, which is partially supported by the U.S. Department of Energy under grants DE-FG02-07ER46453 and DE-FG02-07ER46471.",

year = "2011",

month = oct,

day = "24",

doi = "10.1063/1.3652771",

language = "English (US)",

volume = "99",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "17",

}

TY - JOUR

T1 - High-temperature piezoresponse force microscopy

AU - Bhatia, B.

AU - Karthik, J.

AU - Cahill, D. G.

AU - Martin, L. W.

AU - King, W. P.

N1 - Funding Information: The authors acknowledge support from the Office of Naval Research under Grant Number N00014-10-10525. Some work was performed in the Seitz Materials Research Laboratory, which is partially supported by the U.S. Department of Energy under grants DE-FG02-07ER46453 and DE-FG02-07ER46471.

PY - 2011/10/24

Y1 - 2011/10/24

N2 - We report high temperature piezoresponse force microscopy (PFM) on 100 nm thick PbZr0.2Ti0.8O3 films fabricated on a miniature heater stage. The microfabricated resistive heater allows local temperature control up to 1000 C with minimal electrostatic interactions. The PFM measurements were used to collect piezoelectric hysteresis loops over the temperature range 25-400 C. The piezoresponse increases with temperature and then decreases rapidly near 400 C, which is indicative of ferroelectric- paraelectric phase transition.

AB - We report high temperature piezoresponse force microscopy (PFM) on 100 nm thick PbZr0.2Ti0.8O3 films fabricated on a miniature heater stage. The microfabricated resistive heater allows local temperature control up to 1000 C with minimal electrostatic interactions. The PFM measurements were used to collect piezoelectric hysteresis loops over the temperature range 25-400 C. The piezoresponse increases with temperature and then decreases rapidly near 400 C, which is indicative of ferroelectric- paraelectric phase transition.

UR - http://www.scopus.com/inward/record.url?scp=80555139904&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80555139904&partnerID=8YFLogxK

U2 - 10.1063/1.3652771

DO - 10.1063/1.3652771

M3 - Article

AN - SCOPUS:80555139904

SN - 0003-6951

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 173103

ER -

High-temperature piezoresponse force microscopy

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