High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Gowtham Sriram Jawaharram, Patrick M. Price, Christopher M. Barr, Khalid Hattar, Robert S. Averback, Shen J. Dillon

Research output: Contribution to journalArticlepeer-review

Abstract

Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.

Original languageEnglish (US)
Pages (from-to)1-4
Number of pages4
JournalScripta Materialia
Volume148
DOIs
StatePublished - Apr 15 2018

Keywords

  • Defects
  • In situ transmission electron microscopy (TEM)
  • Irradiation induced creep
  • Silver films

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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