@article{f490f09c80c0489fbb917ccf2c36ec35,
title = "High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy",
abstract = "Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.",
keywords = "Defects, In situ transmission electron microscopy (TEM), Irradiation induced creep, Silver films",
author = "Jawaharram, {Gowtham Sriram} and Price, {Patrick M.} and Barr, {Christopher M.} and Khalid Hattar and Averback, {Robert S.} and Dillon, {Shen J.}",
note = "Funding Information: SJD, GSJ, and RSA were supported by the DOE Office of Basic Energy Sciences, Materials Science and Engineering Division under Grant DEFG02-05ER46217 . CMB and KH were also supported by the DOE BES Materials Science and Engineering Division, but under a separate FWP 15013170 . Access to the in situ IIC capabilities were provided by the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525. Publisher Copyright: {\textcopyright} 2018 Elsevier Ltd.",
year = "2018",
month = apr,
day = "15",
doi = "10.1016/j.scriptamat.2018.01.007",
language = "English (US)",
volume = "148",
pages = "1--4",
journal = "Scripta Materialia",
issn = "1359-6462",
publisher = "Elsevier Limited",
}