High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Gowtham Sriram Jawaharram; Patrick M. Price; Christopher M. Barr; Khalid Hattar; Robert S. Averback; Shen J. Dillon

doi:10.1016/j.scriptamat.2018.01.007

High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Gowtham Sriram Jawaharram, Patrick M. Price, Christopher M. Barr, Khalid Hattar, Robert S. Averback, Shen J. Dillon

Research output: Contribution to journal › Article › peer-review

Abstract

Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.

Original language	English (US)
Pages (from-to)	1-4
Number of pages	4
Journal	Scripta Materialia
Volume	148
DOIs	https://doi.org/10.1016/j.scriptamat.2018.01.007
State	Published - Apr 15 2018

Keywords

Defects
In situ transmission electron microscopy (TEM)
Irradiation induced creep
Silver films

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

Online availability

10.1016/j.scriptamat.2018.01.007

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title = "High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy",

abstract = "Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.",

keywords = "Defects, In situ transmission electron microscopy (TEM), Irradiation induced creep, Silver films",

author = "Jawaharram, {Gowtham Sriram} and Price, {Patrick M.} and Barr, {Christopher M.} and Khalid Hattar and Averback, {Robert S.} and Dillon, {Shen J.}",

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day = "15",

doi = "10.1016/j.scriptamat.2018.01.007",

language = "English (US)",

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T1 - High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

AU - Jawaharram, Gowtham Sriram

AU - Price, Patrick M.

AU - Barr, Christopher M.

AU - Hattar, Khalid

AU - Averback, Robert S.

AU - Dillon, Shen J.

PY - 2018/4/15

Y1 - 2018/4/15

N2 - Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.

AB - Irradiation induced creep (IIC) rates are measured in compression on Ag nanopillar (square) beams in the sink-limited regime. The IIC rate increases linearly with stress at lower stresses, i.e. below ≈2/3 the high temperature yield stress and parabolically with pillar width, L, for L less than ≈300 nm. The data are obtained by combining in situ transmission electron imaging with simultaneous ion irradiation, laser heating, and nanopillar compression. Results in the larger width regime are consistent with prior literature.

KW - Defects

KW - In situ transmission electron microscopy (TEM)

KW - Irradiation induced creep

KW - Silver films

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High temperature irradiation induced creep in Ag nanopillars measured via in situ transmission electron microscopy

Abstract

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