High-speed drift tracking for high-throughput localization microscopy

Hongqiang Ma, Maomao Chen, Yang Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We present a drift tracking algorithm for high throughput localization microscopy. Compared to the conventional drift estimation algorithms that are usually based on image cross-correlation, our method directly performs on the emitter positions and only calculates the local intersection map between the position sets. Our method can significantly accelerate the computation speed and reduce memory usage to enable high precision, high throughput drift estimation. We demonstrate that our algorithm can achieve a sub-second drift tracking time interval and sub-nanometer tracking precision for the high throughput localization microscopy. Our method paves the way for drift-free high throughput localization microscopy.

Original languageEnglish (US)
Title of host publication2022 IEEE Photonics Conference, IPC 2022 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665434874
StatePublished - 2022
Externally publishedYes
Event2022 IEEE Photonics Conference, IPC 2022 - Vancouver, Canada
Duration: Nov 13 2022Nov 17 2022

Publication series

Name2022 IEEE Photonics Conference, IPC 2022 - Proceedings


Conference2022 IEEE Photonics Conference, IPC 2022


  • drift correction
  • localization microscopy

ASJC Scopus subject areas

  • Control and Optimization
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Artificial Intelligence
  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Global and Planetary Change
  • Management, Monitoring, Policy and Law


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