@inproceedings{bdd41a8e4dc04330adde936fe92e2d6e,
title = "High-speed drift tracking for high-throughput localization microscopy",
abstract = "We present a drift tracking algorithm for high throughput localization microscopy. Compared to the conventional drift estimation algorithms that are usually based on image cross-correlation, our method directly performs on the emitter positions and only calculates the local intersection map between the position sets. Our method can significantly accelerate the computation speed and reduce memory usage to enable high precision, high throughput drift estimation. We demonstrate that our algorithm can achieve a sub-second drift tracking time interval and sub-nanometer tracking precision for the high throughput localization microscopy. Our method paves the way for drift-free high throughput localization microscopy.",
keywords = "drift correction, localization microscopy",
author = "Hongqiang Ma and Maomao Chen and Yang Liu",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE Photonics Conference, IPC 2022 ; Conference date: 13-11-2022 Through 17-11-2022",
year = "2022",
doi = "10.1109/IPC53466.2022.9975715",
language = "English (US)",
series = "2022 IEEE Photonics Conference, IPC 2022 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2022 IEEE Photonics Conference, IPC 2022 - Proceedings",
address = "United States",
}