TY - JOUR
T1 - High-resolution transmission electron microscopy of pressure-amorphized -quartz
AU - Winters, Robert R.
AU - Garg, Anita
AU - Hammack, William S.
PY - 1992
Y1 - 1992
N2 - -Quartz becomes x-ray amorphous when compressed, at ambient temperature, by pressures of 25 to 30 GPa. [Hemley et al. Nature 334, 5 (1988)]. The relationship between pressure-amorphized and melt-quenched silica is of great interest. The most fundamental characteristic of melt-quenched silica is its lack of periodicity at the atomic level. We report here that high-resolution electron microscopy shows that -quartz, pressure amorphized at 30.5 GPa is, as is conventional melt-quenched silica, amorphous at the atomic level.
AB - -Quartz becomes x-ray amorphous when compressed, at ambient temperature, by pressures of 25 to 30 GPa. [Hemley et al. Nature 334, 5 (1988)]. The relationship between pressure-amorphized and melt-quenched silica is of great interest. The most fundamental characteristic of melt-quenched silica is its lack of periodicity at the atomic level. We report here that high-resolution electron microscopy shows that -quartz, pressure amorphized at 30.5 GPa is, as is conventional melt-quenched silica, amorphous at the atomic level.
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U2 - 10.1103/PhysRevLett.69.3751
DO - 10.1103/PhysRevLett.69.3751
M3 - Article
AN - SCOPUS:0042909828
SN - 0031-9007
VL - 69
SP - 3751
EP - 3753
JO - Physical review letters
JF - Physical review letters
IS - 26
ER -