Abstract
High-resolution silicon-29 n.m.r. spectroscopic studies indicate that Si-O bond length-chemical shift and bond strength-chemical shift relationships are useful for investigating the structures of crystalline silicates, silicate glasses, clays and zeolites which cannot be examined by single-crystal X-ray or neutron-diffraction methods.-J.A.Z. School of Chemical Sciences, Univ. of Illinois at Urbana-Champaign, Urbana, IL 61801, USA.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1206-1215 |
| Number of pages | 10 |
| Journal | American Mineralogist |
| Volume | 68 |
| Issue number | 11-12 |
| State | Published - 1983 |
| Externally published | Yes |
ASJC Scopus subject areas
- Geophysics
- Geochemistry and Petrology