Abstract
This paper details the creation of experimental and computational frameworks to capture high-resolution, microscale deformation mechanisms and their relation to microstructure over large (mm-scale) fields of view. Scanning electron microscopy with custom automation and external beam control was used to capture 209 low-distortion micrographs of 360 μm × 360 μm each, that were individually correlated using digital image correlation to obtain displacement/strain fields with a spatial resolution of 0.44 μm. Displacement and strain fields, as well as secondary electron images, were subsequently stitched to create a 5.7 mm × 3.4 mm field of view containing 100 million (7678 × 13,004) data points. This approach was demonstrated on Mg WE43 under uniaxial compression, where effective strain was shown to be relatively constant with respect to distance from the grain boundary, and a noticeable increase in the effective strain was found with an increase in the basal Schmid factor. The ability to obtain high-resolution deformations over statistically relevant fields of view enables large data analytics to examine interactions between microstructure, microscale strain localizations, and macroscopic properties.
Original language | English (US) |
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Pages (from-to) | 1407-1421 |
Number of pages | 15 |
Journal | Experimental Mechanics |
Volume | 58 |
Issue number | 9 |
DOIs | |
State | Published - Nov 15 2018 |
Externally published | Yes |
Keywords
- Alignment
- Digital image correlation (DIC)
- Distortion
- External scan
- Stitching
ASJC Scopus subject areas
- Aerospace Engineering
- Mechanics of Materials
- Mechanical Engineering