High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures
A. Haggag, W. McMahon, K. Hess, K. Cheng, J. Lee, J. Lyding
Research output: Contribution to journal › Conference article › peer-review
Fingerprint
Dive into the research topics of 'High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures'. Together they form a unique fingerprint.