High-performance chip reliability from short-time-tests Statistical models for optical interconnect and HCl/TDDB/NBTI deep-submicron transistor failures

  • A. Haggag
  • , W. McMahon
  • , K. Hess
  • , K. Cheng
  • , J. Lee
  • , J. Lyding

Research output: Contribution to journal › Conference article › peer-review

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