High-performance AlGaN/GaN high electron mobility transistors on SiC

V. Kumar, A. Kuliev, R. Schwindt, G. Simin, J. Yang, M. Asif Khan, I. Adesida

Research output: Contribution to journalArticlepeer-review


AlGaN/GaN high electron mobility transistors (HEMTs) grown on semi-insulating SiC substrates with a 0.12μm gate length have been fabricated. These 0.12μm gate length devices exhibited maximum drain current density as high as 1.23 A/mm and peak extrinsic transconductance of 314 mS/mm. A unity gain cut-off frequency (fT) of 121 GHz and maximum frequency of oscillation (fmax) of 162 GHz were measured for these devices. These fT and fmax values are the highest ever reported values for GaN-based HEMTs. Also, a continuous-wave (CW) output power density of 4.2 W/mm with an associated gain of 7.5 dB and a power-added-efficiency (PAE) of 26.4% were obtained at 20 GHz.

Original languageEnglish (US)
Pages (from-to)456-459
Number of pages4
JournalPhysica Status Solidi (A) Applied Research
Issue number2 SPEC.
StatePublished - Dec 2002
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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