High-cyclic fatigue experiments of single crystal silicon in an oxygen-free environment

Shingo Yoneoka, Yu Qiao Qu, Shasha Wang, Matthew W. Messana, Andrew B. Graham, James Salvia, Bongsang Kim, Renata Melamud, Gaurav Bahl, Thomas W. Kenny

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on the first study of fatigue in single crystal silicon MEMS resonators within an extremely clean and controlled environment using the 'epi-seal' encapsulation technology. This packaging technology provides a unique opportunity to investigate controversial issues in silicon fatigue since the devices are not exposed to air, oxygen, organics, or other residues that might complicate the initiation and observation of fatigue. We have conducted fatigue experiments on 10 devices over 1010 actuation cycles with various dynamic loadings ranging from 1.0 to 1.9 GPa at 29°C and from 0.2 to 1.1 GPa at 280°C. No fatigue related phenomena have been observed under these experimental conditions.

Original languageEnglish (US)
Title of host publicationMEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
Pages224-227
Number of pages4
DOIs
StatePublished - 2010
Externally publishedYes
Event23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010 - Hong Kong, China
Duration: Jan 24 2010Jan 28 2010

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
ISSN (Print)1084-6999

Other

Other23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
Country/TerritoryChina
CityHong Kong
Period1/24/101/28/10

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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