Abstract
We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A singlecycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface.We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 839-845 |
| Number of pages | 7 |
| Journal | Journal of Infrared, Millimeter, and Terahertz Waves |
| Volume | 33 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2012 |
| Externally published | Yes |
Keywords
- Graphene
- Multiple internal reflections
- Terahertz imaging
- Time-domain spectroscopy
ASJC Scopus subject areas
- Radiation
- Instrumentation
- Condensed Matter Physics
- Electrical and Electronic Engineering
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