High-altitude shock-layer ultraviolet emissions measured using highly elliptical orbits

Deborah A. Levin, L. C. Howlett, Leonard H. Caveny, David M. Mann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Predicting emissions under rarified flow conditions remains a challenge. Two rocket experiments (at 3.5 and 5 km/s) obtained the UV data under flight conditions using onboard instruments; the greatest discrepancies in the predictions occurred at the higher altitudes. An additional experiment is being planned to extend the velocity to 7 to 8 km/sec using instrumentation onboard a small satellite with a highly elliptical orbit. Scanning spectrometers and photometers will observe the periodic bow shock interactions. The periodic bow shock re-immersion to low altitudes (200 to 120 km) coupled to the orbital decay of the satellite, provide an opportunity to progressively map a broad region of rarified aerodynamics. The paper discusses the flight regime of the planned experiment, provides examples of the anticipated phenomena and calculations, and gives an indication of the preliminary sets of instruments and measurements planned.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsSankaran Gowrinathan, James F. Shanley, C.B. Johnson
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages64-74
Number of pages11
ISBN (Print)0819411884
StatePublished - 1993
Externally publishedYes
EventSurveillance Technologies and Imaging Components - Orlando, FL, USA
Duration: Apr 13 1993Apr 14 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1952
ISSN (Print)0277-786X

Other

OtherSurveillance Technologies and Imaging Components
CityOrlando, FL, USA
Period4/13/934/14/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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